HPE Smart Array P441/4GB FBWC 12Gb 2-ports Ext SAS Controller - 12Gb/s SAS - PCI Express 3.0 x8 - Plug-in Card - RAID Supported - JBOD RAID Level - 2 Total SAS Port(s) - 2 SAS Port(s) External Flash Backed Cache - 726825 B21

Product Description

HPE Smart Array P441/4GB FBWC 12Gb 2-ports Ext SAS Controller - 12Gb/s SAS - PCI Express 3.0 x8 - Plug-in Card - RAID Supported - JBOD RAID Level - 2 Total SAS Port(s) - 2 SAS Port(s) External Flash Backed Cache - 726825 B21

Maximize your server's storage potential with the HPE Smart Array P441/4GB FBWC 12Gb 2-ports Ext SAS Controller. This powerful RAID controller delivers exceptional performance and data protection, ensuring your critical business data is always available and secure.

Unleash the Power of 12Gb/s SAS: Experience lightning-fast data transfer speeds with the 12Gb/s SAS interface, eliminating bottlenecks and accelerating application performance. This enhanced throughput is ideal for demanding workloads and data-intensive applications.

Enhanced Data Protection with FBWC: The integrated 4GB Flash Backed Write Cache (FBWC) safeguards your data against power loss. In the event of an unexpected outage, the FBWC preserves data in cache, preventing data loss and ensuring data integrity.

Flexible RAID Options: Configure your storage to meet your specific needs with support for RAID levels and JBOD. Choose the level of redundancy and performance that aligns with your business requirements, ensuring optimal data availability and protection.

Seamless Integration: Easily integrate the P441 controller into your server environment with its PCI Express 3.0 x8 plug-in card design. The controller's compact form factor simplifies installation and minimizes space requirements.

Key Features:

• 12Gb/s SAS interface for high-speed data transfer
• 4GB Flash Backed Write Cache (FBWC) for data protection
• RAID and JBOD support for flexible configuration
• 2 External SAS Ports for connecting storage devices
• PCI Express 3.0 x8 plug-in card for easy installation
• HPE quality and reliability